The NIST test suite was launched by the National Institute of Standards and Technology (NIST) in 2001 .It is a statistical package consisting of 16 tests that were developed to test the randomness of arbitrary long binary sequences produced by either hardware or software based cryptographic random or pseudorandom number generators. These tests focus on a variety diﬀerent types of non-randomness that could exist in a sequence.

For each statistical test, a set of P-values, which is corresponding to the set of sequences, is produced. Each sequence is called success if the corresponding P-value satisﬁes the condition P-value ≥ α, and is called failure otherwise. For a ﬁxed signiﬁcance level α, 100α % of P-values are expected to indicate failure.

**Reference**

1. Kim S J, Umeno K, Hasegawa A. Corrections of the NIST statistical test suite for randomness[J]. arXiv preprint nlin/0401040, 2004.NIST_01.pdf

2. Soto J. Statistical testing of random number generators[C]//Proceedings of the 22nd National Information Systems Security Conference. Gaithersburg, MD: NIST, 1999, 10(99): 12.NIST_02.pdf

3. Rukhin A, Soto J, Nechvatal J, et al. Statistical test suite for random and pseudorandom number generators for cryptographic applications, NIST special publication[J]. 2010.NIST_03.pdf